Elaboration Des Couches Minces Semi-conductrices Pour Des Applications Optoélectronique

Résumé: In this work, we have mainly studied the structural properties and Zinc oxide (ZnO) thin film optics developed using spray pyrolysis techniques. We have prepared undoped ZnO thin films doped with nickel 1 and 9% at (ZN1, ZN9). The films were deposited on glass and silicon substrates at 450 ° C. The fabricated films were analyzed by different techniques: X-ray diffraction (XRD), UV-visible spectrophotometry, waveguiding spectroscopy (M-Lines) and the Hall effect. The study carried out shows that all zinc oxide films produced in this way have a hexagonal würzite-type structure with the preferential orientation according to the direction (002) coincident with the c axis perpendicular to the surface of the substrates. Grain size deduced from DRX measurements varies between 42 and 38 nm. waveguiding measurements by prism (M-lines) show that the pure and doped ZnO films have two modes (for TE and TM polarizations). The values of the oplical band gap, determined from the transmission spectra for the films deposited on glass, varied between 3.28 and 3.24 eV for ZnO and 3.52 and 3.80 eV for NiO. The electrical conductivity and the concentration of charge carriers, measured using the Hall effect, indicate n-type conduction for all ZnO and ZN1 films. The electrical conductivity and the concentration of charge carriers measured using the Hall effect showed that the n-type transport of all ZnO films deposited

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